fix(docs): fix formatting issues in README.md

- adapt meta-/code-/obs- rules to the local Python benchmark pipeline
- replace db-sql-ddl, code-config-env-scope, test-e2e-pytest with pipeline equivalents
- add code-python-style, data-determinism, data-naming-units, bench-methodology, build-pipeline-tasks
- normalize specs and README typography to ASCII per code-data-formatting
- rewrite root CLAUDE.md trigger table; add .cursorrules and .gitignore
- specs: pipeline plan and task specs 00-11
- rules: 19 binding rule files adapted for this project
- docs: CLAUDE.md rule-trigger table
- config: .cursorrules commit convention, .gitignore excluding out/ and .venv/
- docs: rewrite README.md with pipeline diagrams, setup guide, result placeholders
- config: requirements.txt for the closed dependency list
- datagen: make_lab_config.py writes out/config/lab_config.yaml and .done marker

docs/specs/01_lab_configuration.md

@@ -0,0 +1,56 @@
+# 01 - Laboratory Configuration
+
+## Context / Goal
+Define the authoritative laboratory model that all downstream tasks (data generation, ontology, schemas) must follow. This file is a specification, not code; produce `./out/config/lab_config.yaml` capturing everything below.
+
+## Dependencies
+None (root task).
+
+## Material system
+- Substrate: Ti-6Al-4V coupons, 10 × 10 × 3 mm.
+- Adhesion layer: Cr (sputtered).
+- Functional coating: Pt-Au deposited in a **composition gradient** across each wafer; film thickness range 0.3-1.1 µm.
+
+## Instruments
+| Role | Instrument | Data produced |
+|---|---|---|
+| Friction | RAPID custom high-throughput parallelized 6-probe tribometer | COF vs cycle per track; test conditions |
+| Nanoindentation | Bruker TI980 TriboIndenter | Hardness, reduced modulus (25 indents/coupon) |
+| Composition | Bruker M4 Tornado micro-XRF (assumed model) | Pt/Au wt% map per coupon (20×20 grid) |
+| Deposition | Kurt J. Lesker PVD 200 sputter-down | Batch deposition parameters |
+| Surface roughness | AFM | Topography image metadata + Ra/Rq per coupon |
+| Film thickness | Optical profilometry | Thickness map per coupon (10×10 grid) |
+| Simulation | SIMTRA (sputter transport Monte-Carlo) | Deposition atom-energy / composition profiles per deposition run |
+
+## Deposition matrix (4 batches)
+| Batch | Pt:Au gun tilt | Pt power | Au power | Pt discharge | Au discharge |
+|---|---|---|---|---|---|
+| B721 | 20°:0°  | 150 W | 50 W  | 432 V | 311 V |
+| B722 | 20°:20° | 100 W | 100 W | 399 V | 352 V |
+| B723 | 20°:20° | 150 W | 50 W  | 430 V | 311 V |
+| B724 | 0°:20°  | 50 W  | 150 W | 376 V | 340 V |
+
+## Hierarchy and volumes
+```
+batch (×4) → wafer (×3 per batch) → coupon (×49 per wafer, 7×7 grid) = 588 coupons
+```
+- Friction testing: 480 coupons (4 RAPID runs × 120 coupons: 5 plates × 6 probes × 4 coupons/square).
+- Reserve/QA: 108 coupons (no friction data; characterization only).
+- Environments: run R1,R2 = Lab Air (µ_normal); run R3,R4 = Dry N2 (µ_dry_nit).
+- Tracks: 3 replicate tracks per friction coupon, identical conditions, fresh counterface ball per track (3 balls per holder) → 1,440 tracks.
+- Cycles: 1,000 reciprocating cycles per track → 1,440,000 cycle records.
+- Friction loops: every 100th cycle stores a position-resolved loop of 200 points → 1,440 × 10 × 200 = 2,880,000 loop points.
+- Nominal test conditions: normal load 100 mN, stroke 1 mm, sliding speed 1 mm/s, ruby (Al2O3) ball Ø 3.175 mm; RH 45% (Lab Air) / 2% (Dry N2); T 23 ± 1 °C.
+
+## Physical models for value simulation (used in task 03)
+- Coupon Au wt%: linear gradient across wafer x-position, batch-dependent center: B721 8%, B722 25%, B723 10%, B724 60%; ±5 wt% span across wafer; XRF grid adds N(0, 0.3) noise.
+- COF run-in: `cof(c) = cof_ss + (cof_0 - cof_ss)·exp(-c/τ) + N(0, σ)`; cof_0 ∈ [0.35, 0.5]; τ ∈ [100, 400] cycles; σ = 0.01.
+- Steady-state COF depends on Au% and environment: Lab Air `cof_ss = 0.32 - 0.0015·Au%`; Dry N2 `cof_ss = 0.24 - 0.0012·Au%`; clamp ≥ 0.12.
+- Hardness: `H = 8.5 - 0.05·Au% + N(0, 0.25)` GPa; reduced modulus `Er = 190 - 0.6·Au% + N(0, 4)` GPa.
+- Roughness Ra: log-normal, median 5 nm, σ_log 0.3.
+- Thickness: 0.3-1.1 µm, radial wafer profile + noise.
+- Wear volume per track: Archard-like `V = k·F·s`, k depends on Au% and environment; store as track-level derived measurement.
+
+## Output
+- `./out/config/lab_config.yaml` - machine-readable version of everything above (volumes, matrices, model coefficients, seed).
+- Marker `./out/.done/01.ok`.