feat(config): update .gitignore to exclude output artifacts and add config files

- ignore all output files except for reports and config directories
- add new .done files for tasks 01-11 to track completion status
- include new configuration files for hardware prices and lab setup
- generate process flow and report documents for tasks 02 and 11
This commit is contained in:
administrator
2026-07-11 23:52:28 -04:00
parent a4c0d258eb
commit af91629f71
41 changed files with 1028 additions and 1 deletions

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flowchart LR
A([Ti-6Al-4V Base 10x10x3 mm]) --> B[Cleaning]
B --> B1([Rinsed in deionized water])
B1 --> B2([Sonicated in cleaning solution])
B --> C[Smearing Adhesive]
C --> C1([Cr adhesive coating])
C --> D[Vapor Deposition System<br/>Kurt J. Lesker PVD 200]
D --> D1([PtAu sputter coating, gradient])
D --> E([Test Coupon])

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flowchart LR
TC([Test Coupon]) --> S[SIMTRA simulation<br/>composition / atom energies]
S --> OP[Optical profilometry<br/>film thickness 0.3-1.1 um]
OP --> TW[Assemble Test Wafer<br/>x49 coupons]
TW --> TB[Assemble Test Batch<br/>x3 wafers]
TB --> B721[B721<br/>Pt 150 W / Au 50 W]
TB --> B722[B722<br/>Pt 100 W / Au 100 W]
TB --> B723[B723<br/>Pt 150 W / Au 50 W]
TB --> B724[B724<br/>Pt 50 W / Au 150 W]

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flowchart TD
TC([Test Coupon]) --> F[Friction<br/>RAPID 6-probe tribometer]
F --> FA([Lab Air -> COF dataset mu_normal])
F --> FN([Dry N2 -> COF dataset mu_dry_nit])
TC --> NI[Nanoindentation<br/>Bruker TI980]
NI --> NIR([Hardness, reduced modulus<br/>25 indents per coupon])
TC --> AF[AFM]
AF --> AFR([Topography -> Ra / Rq])
TC --> XR[micro-XRF<br/>Bruker M4 Tornado]
XR --> XRR([Pt/Au wt% map, 20x20 grid])

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sequenceDiagram
actor Op as Operator
participant Prep as Sample Prep
participant Plan as Excel Test Plan
participant SW as Control Software
participant TR as RAPID Tribometer
Op->>Prep: Request test
Op->>Prep: Get samples
Op->>Prep: Load samples onto plates
Op->>Prep: Load ball holders (3 counterfaces per holder)
Op->>Plan: Create test plan<br/>(Sample Plate, Plate Location, Sample ID, Save Location,<br/>Folder Name, X/Y/Z Offset, Load, Iterations)
Op->>TR: Transfer plates to tribometer
Op->>TR: Set up platter
Op->>SW: Activate software
Op->>SW: Load plan
SW->>TR: Activate tribometer
TR-->>SW: Run reciprocating tests (execution loop, see D5)
Op->>SW: Software stop
SW-->>Op: Save avg files
Op->>TR: Remove plates and platters
Op->>SW: Close software
Op->>TR: Pull equipment out

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flowchart TD
L[Load all counterfaces] --> P{5 plates}
P -->|for each plate| PR{6 probes in parallel}
PR -->|for each probe| C{4 coupons on coupon square}
C -->|for each coupon| T[Draw track]
T --> RC[Rotate counterface - fresh ball per track]
RC -->|3 tracks per coupon| T
T --> DONE([120 coupons x 3 tracks = 360 tracks per run])

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erDiagram
DEPOSITION_RUN ||--|| SIMTRA_PROFILE : produces
DEPOSITION_RUN ||--|| BATCH : creates
BATCH ||--|{ WAFER : contains
WAFER ||--|{ COUPON : contains
COUPON ||--|| XRF_MAP : has
COUPON ||--|| NANOINDENTATION : has
COUPON ||--|| AFM : has
COUPON ||--|| PROFILOMETRY : has
COUPON ||--o{ TRACK : "friction coupons only"
TRACK ||--|{ CYCLE : has
TRACK ||--|{ LOOP_POINT : has
TRACK ||--|| WEAR : has