feat(config): update .gitignore to exclude output artifacts and add config files

- ignore all output files except for reports and config directories - add new .done files for tasks 01-11 to track completion status - include new configuration files for hardware prices and lab setup - generate process flow and report documents for tasks 02 and 11
2026-07-11 23:52:28 -04:00
parent a4c0d258eb
commit af91629f71
41 changed files with 1028 additions and 1 deletions
--- a/out/config/hw_prices.yaml
+++ b/out/config/hw_prices.yaml
@@ -0,0 +1,18 @@
+# Hardware cost parameters for extrapolation (task 10).
+# Street prices retrieved 2026-07-11 from the sources below (server DRAM is
+# in a documented 2025-2026 price surge - see market_context). The cost
+# model buys whole components: 64 GB RDIMM modules and 7.68 TB NVMe drives.
+# Operator-editable; re-run extrapolate.py after changes (code-config-yaml).
+as_of: "2026-07-11"
+ram_module_gb: 64
+ram_module_usd: 1887.0       # A-Tech 64GB (2x32GB) DDR5-5600 ECC RDIMM
+nvme_drive_tb: 7.68
+nvme_drive_usd: 3995.0       # Cloud Ninjas NEW 7.68TB NVMe U.2 1DWPD (Dell 14-16G)
+server_16_core_usd: 4618.0   # Supermicro AS-1015CS-TNR 1U (EPYC 9004/9005), Broadberry starting config
+server_32_core_usd: 6272.0   # Supermicro AS-1115CS-TNR 1U, Broadberry starting config
+extra_node_usd: 4618.0       # one additional entry 1U node (AS-1015CS-TNR chassis)
+sources:
+  ram: https://atechmemory.com/collections/ddr5-memory-ram
+  nvme: https://cloudninjas.com/products/new-7-68tb-nvme-u-2-1dwpd-sie-2-5-enterprise-solid-state-drive-for-14th-15th-16th-gen-dell
+  servers: https://www.broadberry.com/amd-epyc-9004-supermicro-servers
+  market_context: https://www.techpowerup.com/342331/server-dram-pricing-jumps-50-only-70-of-orders-getting-filled
--- a/out/config/lab_config.yaml
+++ b/out/config/lab_config.yaml
@@ -0,0 +1,246 @@
+# Generated by make_lab_config.py (task 01) from docs/specs/01_lab_configuration.md.
+# Do not hand-edit: regenerate via `python make_lab_config.py`.
+project: LabDataStorageEvaluation
+description: Simulated tribology laboratory (Sandia Pt-Au LDRD context)
+spec: docs/specs/01_lab_configuration.md
+seed: 20260711
+material_system:
+  substrate:
+    material: Ti-6Al-4V
+    dimensions_mm:
+    - 10
+    - 10
+    - 3
+  adhesion_layer:
+    material: Cr
+    process: sputtered
+  coating:
+    material: Pt-Au
+    deposition: composition gradient across each wafer
+    thickness_um_range:
+    - 0.3
+    - 1.1
+instruments:
+- instrument_id: rapid
+  role: friction
+  name: RAPID custom high-throughput parallelized 6-probe tribometer
+  data_produced: COF vs cycle per track; test conditions
+- instrument_id: ti980
+  role: nanoindentation
+  name: Bruker TI980 TriboIndenter
+  data_produced: hardness, reduced modulus (25 indents per coupon)
+- instrument_id: m4_tornado
+  role: composition
+  name: Bruker M4 Tornado micro-XRF
+  data_produced: Pt/Au wt% map per coupon (20x20 grid)
+- instrument_id: pvd200
+  role: deposition
+  name: Kurt J. Lesker PVD 200 sputter-down
+  data_produced: batch deposition parameters
+- instrument_id: afm
+  role: surface_roughness
+  name: AFM
+  data_produced: topography image metadata + Ra/Rq per coupon
+- instrument_id: profilometer
+  role: film_thickness
+  name: Optical profilometry
+  data_produced: thickness map per coupon (10x10 grid)
+- instrument_id: simtra
+  role: simulation
+  name: SIMTRA sputter transport Monte-Carlo
+  data_produced: deposition atom-energy / composition profiles per deposition run
+deposition_matrix:
+- batch_code: B721
+  pt_gun_tilt_deg: 20
+  au_gun_tilt_deg: 0
+  pt_power_W: 150
+  au_power_W: 50
+  pt_discharge_V: 432
+  au_discharge_V: 311
+- batch_code: B722
+  pt_gun_tilt_deg: 20
+  au_gun_tilt_deg: 20
+  pt_power_W: 100
+  au_power_W: 100
+  pt_discharge_V: 399
+  au_discharge_V: 352
+- batch_code: B723
+  pt_gun_tilt_deg: 20
+  au_gun_tilt_deg: 20
+  pt_power_W: 150
+  au_power_W: 50
+  pt_discharge_V: 430
+  au_discharge_V: 311
+- batch_code: B724
+  pt_gun_tilt_deg: 0
+  au_gun_tilt_deg: 20
+  pt_power_W: 50
+  au_power_W: 150
+  pt_discharge_V: 376
+  au_discharge_V: 340
+hierarchy:
+  batches: 4
+  wafers_per_batch: 3
+  coupon_grid_per_wafer:
+  - 7
+  - 7
+  coupons_per_wafer: 49
+friction_assignment:
+  friction_coupons_total: 480
+  reserve_coupons_total: 108
+  runs: 4
+  coupons_per_run: 120
+  plates_per_run: 5
+  probes_per_plate: 6
+  coupons_per_probe_square: 4
+  tracks_per_friction_coupon: 3
+  counterfaces_per_holder: 3
+  fresh_counterface_per_track: true
+  reserve_grid_positions:
+  - 1
+  - 4
+  - 7
+  - 22
+  - 25
+  - 28
+  - 43
+  - 46
+  - 49
+volumes:
+  coupons_total: 588
+  tracks_total: 1440
+  cycles_per_track: 1000
+  cycle_rows_total: 1440000
+  loop_every_n_cycles: 100
+  loops_per_track: 10
+  loop_points_per_loop: 200
+  loop_points_total: 2880000
+  xrf_grid:
+  - 20
+  - 20
+  xrf_points_per_coupon: 400
+  xrf_points_total: 235200
+  profilometry_grid:
+  - 10
+  - 10
+  profilometry_points_per_coupon: 100
+  nanoindentation_indents_per_coupon: 25
+  simtra_rows_per_batch: 1000
+runs:
+- run_code: R1
+  batch_code: B721
+  environment: lab_air
+  date: '2026-04-06'
+  operator: A. Reyes
+- run_code: R2
+  batch_code: B722
+  environment: lab_air
+  date: '2026-04-13'
+  operator: K. Patel
+- run_code: R3
+  batch_code: B723
+  environment: dry_n2
+  date: '2026-04-20'
+  operator: A. Reyes
+- run_code: R4
+  batch_code: B724
+  environment: dry_n2
+  date: '2026-04-27'
+  operator: M. Novak
+schedule:
+  deposition_start_date: '2026-03-02'
+  batch_interval_days: 7
+  characterization_lag_days: 3
+  run_start_time: 09:00:00
+  track_interval_s: 2100
+test_conditions:
+  normal_load_mN: 100
+  stroke_mm: 1.0
+  speed_mm_s: 1.0
+  counterface:
+    material: ruby (Al2O3)
+    diameter_mm: 3.175
+  rh_pct:
+    lab_air: 45
+    dry_n2: 2
+  temperature_C: 23
+  temperature_tolerance_C: 1
+physical_models:
+  au_gradient:
+    description: linear Au wt% gradient along wafer x, batch-dependent center
+    batch_center_wtpct:
+      B721: 8
+      B722: 25
+      B723: 10
+      B724: 60
+    wafer_span_wtpct: 5
+    xrf_noise_sd_wtpct: 0.3
+  cof_run_in:
+    formula: cof(c) = cof_ss + (cof_0 - cof_ss) * exp(-c / tau) + N(0, sigma)
+    cof_0_range:
+    - 0.35
+    - 0.5
+    tau_cycles_range:
+    - 100
+    - 400
+    noise_sd: 0.01
+  cof_steady_state:
+    formula: cof_ss = intercept + slope_per_au_wtpct * au_wtpct_mean, clamped to >= floor
+    lab_air:
+      intercept: 0.32
+      slope_per_au_wtpct: -0.0015
+    dry_n2:
+      intercept: 0.24
+      slope_per_au_wtpct: -0.0012
+    floor: 0.12
+  hardness_GPa:
+    formula: H = intercept + slope_per_au_wtpct * au_wtpct_mean + N(0, noise_sd)
+    intercept: 8.5
+    slope_per_au_wtpct: -0.05
+    noise_sd: 0.25
+  reduced_modulus_GPa:
+    formula: Er = intercept + slope_per_au_wtpct * au_wtpct_mean + N(0, noise_sd)
+    intercept: 190
+    slope_per_au_wtpct: -0.6
+    noise_sd: 4
+  roughness_ra_nm:
+    distribution: lognormal
+    median_nm: 5
+    sigma_log: 0.3
+    rq_over_ra: 1.25
+  thickness_um:
+    profile: radial parabolic across wafer plus noise
+    center_um: 1.05
+    edge_um: 0.35
+    noise_sd_um: 0.02
+    range_um:
+    - 0.3
+    - 1.1
+  wear_archard:
+    formula: V = k * F * s; k = k0 * (1 + slope_per_au_wtpct * au_wtpct_mean), lognormal noise, clamped
+      to >= k_floor
+    k0_mm3_per_N_m:
+      lab_air: 1.5e-07
+      dry_n2: 6.0e-08
+    slope_per_au_wtpct:
+      lab_air: -0.008
+      dry_n2: -0.01
+    k_floor_mm3_per_N_m: 1.0e-09
+    noise_sigma_log: 0.15
+  friction_loop:
+    force_noise_sd_mN: 0.3
+  nanoindentation:
+    max_load_mN: 10
+    indent_grid:
+    - 5
+    - 5
+    grid_pitch_um: 20
+  simtra:
+    angle_deg_range:
+    - 0
+    - 90
+    energy_eV_max: 50
+    surface_binding_energy_eV:
+      pt: 5.84
+      au: 3.81
+    flux_per_W: 0.02