# Generated by make_lab_config.py (task 01) from docs/specs/01_lab_configuration.md.
# Do not hand-edit: regenerate via `python make_lab_config.py`.
project: LabDataStorageEvaluation
description: Simulated tribology laboratory (Sandia Pt-Au LDRD context)
spec: docs/specs/01_lab_configuration.md
seed: 20260711
material_system:
  substrate:
    material: Ti-6Al-4V
    dimensions_mm:
    - 10
    - 10
    - 3
  adhesion_layer:
    material: Cr
    process: sputtered
  coating:
    material: Pt-Au
    deposition: composition gradient across each wafer
    thickness_um_range:
    - 0.3
    - 1.1
instruments:
- instrument_id: rapid
  role: friction
  name: RAPID custom high-throughput parallelized 6-probe tribometer
  data_produced: COF vs cycle per track; test conditions
- instrument_id: ti980
  role: nanoindentation
  name: Bruker TI980 TriboIndenter
  data_produced: hardness, reduced modulus (25 indents per coupon)
- instrument_id: m4_tornado
  role: composition
  name: Bruker M4 Tornado micro-XRF
  data_produced: Pt/Au wt% map per coupon (20x20 grid)
- instrument_id: pvd200
  role: deposition
  name: Kurt J. Lesker PVD 200 sputter-down
  data_produced: batch deposition parameters
- instrument_id: afm
  role: surface_roughness
  name: AFM
  data_produced: topography image metadata + Ra/Rq per coupon
- instrument_id: profilometer
  role: film_thickness
  name: Optical profilometry
  data_produced: thickness map per coupon (10x10 grid)
- instrument_id: simtra
  role: simulation
  name: SIMTRA sputter transport Monte-Carlo
  data_produced: deposition atom-energy / composition profiles per deposition run
deposition_matrix:
- batch_code: B721
  pt_gun_tilt_deg: 20
  au_gun_tilt_deg: 0
  pt_power_W: 150
  au_power_W: 50
  pt_discharge_V: 432
  au_discharge_V: 311
- batch_code: B722
  pt_gun_tilt_deg: 20
  au_gun_tilt_deg: 20
  pt_power_W: 100
  au_power_W: 100
  pt_discharge_V: 399
  au_discharge_V: 352
- batch_code: B723
  pt_gun_tilt_deg: 20
  au_gun_tilt_deg: 20
  pt_power_W: 150
  au_power_W: 50
  pt_discharge_V: 430
  au_discharge_V: 311
- batch_code: B724
  pt_gun_tilt_deg: 0
  au_gun_tilt_deg: 20
  pt_power_W: 50
  au_power_W: 150
  pt_discharge_V: 376
  au_discharge_V: 340
hierarchy:
  batches: 4
  wafers_per_batch: 3
  coupon_grid_per_wafer:
  - 7
  - 7
  coupons_per_wafer: 49
friction_assignment:
  friction_coupons_total: 480
  reserve_coupons_total: 108
  runs: 4
  coupons_per_run: 120
  plates_per_run: 5
  probes_per_plate: 6
  coupons_per_probe_square: 4
  tracks_per_friction_coupon: 3
  counterfaces_per_holder: 3
  fresh_counterface_per_track: true
  reserve_grid_positions:
  - 1
  - 4
  - 7
  - 22
  - 25
  - 28
  - 43
  - 46
  - 49
volumes:
  coupons_total: 588
  tracks_total: 1440
  cycles_per_track: 1000
  cycle_rows_total: 1440000
  loop_every_n_cycles: 100
  loops_per_track: 10
  loop_points_per_loop: 200
  loop_points_total: 2880000
  xrf_grid:
  - 20
  - 20
  xrf_points_per_coupon: 400
  xrf_points_total: 235200
  profilometry_grid:
  - 10
  - 10
  profilometry_points_per_coupon: 100
  nanoindentation_indents_per_coupon: 25
  simtra_rows_per_batch: 1000
runs:
- run_code: R1
  batch_code: B721
  environment: lab_air
  date: '2026-04-06'
  operator: A. Reyes
- run_code: R2
  batch_code: B722
  environment: lab_air
  date: '2026-04-13'
  operator: K. Patel
- run_code: R3
  batch_code: B723
  environment: dry_n2
  date: '2026-04-20'
  operator: A. Reyes
- run_code: R4
  batch_code: B724
  environment: dry_n2
  date: '2026-04-27'
  operator: M. Novak
schedule:
  deposition_start_date: '2026-03-02'
  batch_interval_days: 7
  characterization_lag_days: 3
  run_start_time: 09:00:00
  track_interval_s: 2100
test_conditions:
  normal_load_mN: 100
  stroke_mm: 1.0
  speed_mm_s: 1.0
  counterface:
    material: ruby (Al2O3)
    diameter_mm: 3.175
  rh_pct:
    lab_air: 45
    dry_n2: 2
  temperature_C: 23
  temperature_tolerance_C: 1
physical_models:
  au_gradient:
    description: linear Au wt% gradient along wafer x, batch-dependent center
    batch_center_wtpct:
      B721: 8
      B722: 25
      B723: 10
      B724: 60
    wafer_span_wtpct: 5
    xrf_noise_sd_wtpct: 0.3
  cof_run_in:
    formula: cof(c) = cof_ss + (cof_0 - cof_ss) * exp(-c / tau) + N(0, sigma)
    cof_0_range:
    - 0.35
    - 0.5
    tau_cycles_range:
    - 100
    - 400
    noise_sd: 0.01
  cof_steady_state:
    formula: cof_ss = intercept + slope_per_au_wtpct * au_wtpct_mean, clamped to >= floor
    lab_air:
      intercept: 0.32
      slope_per_au_wtpct: -0.0015
    dry_n2:
      intercept: 0.24
      slope_per_au_wtpct: -0.0012
    floor: 0.12
  hardness_GPa:
    formula: H = intercept + slope_per_au_wtpct * au_wtpct_mean + N(0, noise_sd)
    intercept: 8.5
    slope_per_au_wtpct: -0.05
    noise_sd: 0.25
  reduced_modulus_GPa:
    formula: Er = intercept + slope_per_au_wtpct * au_wtpct_mean + N(0, noise_sd)
    intercept: 190
    slope_per_au_wtpct: -0.6
    noise_sd: 4
  roughness_ra_nm:
    distribution: lognormal
    median_nm: 5
    sigma_log: 0.3
    rq_over_ra: 1.25
  thickness_um:
    profile: radial parabolic across wafer plus noise
    center_um: 1.05
    edge_um: 0.35
    noise_sd_um: 0.02
    range_um:
    - 0.3
    - 1.1
  wear_archard:
    formula: V = k * F * s; k = k0 * (1 + slope_per_au_wtpct * au_wtpct_mean), lognormal noise, clamped
      to >= k_floor
    k0_mm3_per_N_m:
      lab_air: 1.5e-07
      dry_n2: 6.0e-08
    slope_per_au_wtpct:
      lab_air: -0.008
      dry_n2: -0.01
    k_floor_mm3_per_N_m: 1.0e-09
    noise_sigma_log: 0.15
  friction_loop:
    force_noise_sd_mN: 0.3
  nanoindentation:
    max_load_mN: 10
    indent_grid:
    - 5
    - 5
    grid_pitch_um: 20
  simtra:
    angle_deg_range:
    - 0
    - 90
    energy_eV_max: 50
    surface_binding_energy_eV:
      pt: 5.84
      au: 3.81
    flux_per_W: 0.02
